Dr. Yihui Zhang
at State Key Laboratory of Modern Optical Instrumentation,
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Image processing algorithms and systems, Defect detection, Detection and tracking algorithms, Image processing, Image quality, Gaussian filters, Machine vision, Image filtering

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Optical components, Detection and tracking algorithms, Image processing, Pattern recognition, Parallel processing, Machine vision

Proceedings Article | 26 October 2018
Proc. SPIE. 10742, Optical Manufacturing and Testing XII
KEYWORDS: Finite-difference time-domain method, Defect detection, Imaging systems, Scattering, Calibration, Image processing, Light scattering, Computer simulations, 3D modeling, Defect inspection

Proceedings Article | 14 September 2018
Proc. SPIE. 10742, Optical Manufacturing and Testing XII
KEYWORDS: Optical components, Microscopes, Imaging systems, Image processing, Light scattering, Inspection, Optical testing, Spherical lenses

Proceedings Article | 24 November 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Electron beam lithography, Diffraction, Finite-difference time-domain method, Imaging systems, Scattering, Calibration, Light scattering, Inspection, Electromagnetism, Electromagnetic scattering

Showing 5 of 8 publications
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