Dr. Yin Bai
at National Institute of Metrology
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Metrology, Roads, Optical sensors, Clocks, Doppler effect, Calibration, Satellites, Error analysis, Receivers, Global Positioning System

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Radar, Metrology, Doppler effect, Sensors, Error analysis, Photography, Time metrology, Signal processing, Distance measurement, Standards development

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