Yin Zhang
at Shanghai Jiao Tong Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 March 2009
Proc. SPIE. 7125, Eighth International Symposium on Optical Storage and 2008 International Workshop on Information Data Storage
KEYWORDS: Switching, Annealing, In situ metrology, Crystals, Germanium, Resistance, Calorimetry, Antimony, Tellurium, Temperature metrology

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