Yinan Kong
at Univ of Adelaide
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 28, 2005
Proc. SPIE. 5649, Smart Structures, Devices, and Systems II
KEYWORDS: Digital signal processing, Radon, Digital filtering, Error analysis, Computing systems, Smart structures, CRTs, Electronics engineering, Error control coding, Binary data

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