Dr. Ying-Chieh Chen
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 September 2010
Proc. SPIE. 7804, Developments in X-Ray Tomography VII
KEYWORDS: Lithography, Refractive index, Stereoscopy, Polymers, X-rays, Reflectivity, Image resolution, Photonic crystals, X-ray imaging, Absorption

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