This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.
Structured Light Imaging (SLI) is a means of digital reconstruction, or Three-Dimensional (3D) scanning, and has uses that span many disciplines. A projector, camera and Personal Computer (PC) are required to perform such 3D scans. Slight variances in synchronization between these three devices can cause malfunctions in the process due to the limitations of PC graphics processors as real-time systems. Previous work used a Field Programmable Gate Array (FPGA) to both drive the projector and trigger the camera, eliminating these timing issues, but still needing an external camera. This work proposes the incorporation of the camera with the FPGA SLI controller by means of a custom printed circuit board (PCB) design. Featuring a high speed image sensor as well as High Definition Multimedia Interface (HDMI) input and output, this PCB enables the FPGA to perform SLI scans as well as pass through HDMI video to the projector for Spatial Augmented Reality (SAR) purposes. Minimizing ripple noise on the power supply by means of effective circuit design and PCB layout, creates a compact and cost effective machine vision sensing solution.
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