CONFERENCE PROCEEDINGS
Advanced Search
Yingfeng Li
at Texas A&M Univ
SPIE Involvement:
Author
Publications (2)
Proceedings Article | 23 May 2005 Open Access Paper
Why did Intel fail with 60 nanometers? Reiteration of the noise, information, speed, and heat aspects of the breakdown of Moore's Law
Proceedings Volume 5844, (2005) https://doi.org/10.1117/12.609553
KEYWORDS: Energy efficiency, Clocks, Oxides, Error analysis, Switching, Transistors, Solids, Lithium, Electrical engineering, Physics
DOWNLOAD PAPER
Proceedings Article | 23 May 2005 Paper
Temperature dependent analysis of resistance fluctuations in Taguchi gas sensors
Shuyi Ma, Zijun Ma, Yingfeng Li
Proceedings Volume 5846, (2005) https://doi.org/10.1117/12.609543
KEYWORDS: Sensors, Surface plasmons, Resistance, Gas sensors, Manufacturing, Semiconductors, Performance modeling, Signal processing, Electronics, Metals
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top