Yingfeng Li
at Texas A&M Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5846, Noise and Information in Nanoelectronics, Sensors, and Standards III
KEYWORDS: Semiconductors, Electronics, Surface plasmons, Gas sensors, Sensors, Metals, Manufacturing, Resistance, Signal processing, Performance modeling

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Oxides, Energy efficiency, Lithium, Clocks, Switching, Error analysis, Physics, Solids, Transistors, Electrical engineering

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