Prof. Yinglong Wang
at Hebei Univ
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | May 4, 2015
Proc. SPIE. 9543, Third International Symposium on Laser Interaction with Matter
KEYWORDS: Nanoparticles, Chemical species, Particles, Silicon, Laser ablation, Monte Carlo methods, Optical simulations, Helium, Pulsed laser deposition, Protactinium

PROCEEDINGS ARTICLE | December 21, 2013
Proc. SPIE. 9047, 2013 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication
KEYWORDS: Nanoparticles, Glasses, Particles, Crystals, Silicon, Scanning electron microscopy, Raman spectroscopy, Laser ablation, Single crystal X-ray diffraction, Protactinium

PROCEEDINGS ARTICLE | October 7, 2010
Proc. SPIE. 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Thin films, Nanoparticles, Chemical species, Particles, Crystals, Silicon, Semiconductor lasers, Scanning electron microscopy, Raman spectroscopy, Laser ablation

PROCEEDINGS ARTICLE | November 14, 2007
Proc. SPIE. 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Nanoparticles, Argon, Particles, Crystals, Silicon, Scanning electron microscopy, Raman spectroscopy, Laser ablation, Erbium, Protactinium

PROCEEDINGS ARTICLE | November 14, 2007
Proc. SPIE. 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Amorphous silicon, Thin films, Nanoparticles, Crystals, Silicon, Scanning electron microscopy, Raman spectroscopy, Silicon films, Laser crystals, Pulsed laser operation

PROCEEDINGS ARTICLE | November 14, 2007
Proc. SPIE. 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Nanoparticles, Particles, Crystals, Silicon, Semiconductor lasers, Scanning electron microscopy, Raman spectroscopy, Laser ablation, Plasma, Single crystal X-ray diffraction

Showing 5 of 9 publications
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