The propagation properties of elliptically polarized light in one dimensional photonic crystal with a magneto-optical defect layer is studied. The one-dimensional photonic crystal is composed of GaAs (H) and Ta2O5 (L), the defect layer material is magneto-optical material Ce:YIG (M), and the structure model of one-dimensional photonic crystal with a magneto-optical defect layer is designed as (L/H)<sup>N</sup>/M/ (H/L)<sup>N</sup>. The propagation properties of elliptically polarized light is calculated numerically by using the 4 × 4 transfer matrix method, and the possibility in the polarization controller is discussed. The results shows that the polarization state of the elliptically polarized light is changed with the increase of applied magnetic field, when the center wavelength is 1550 nm, N=8 and the phase difference (φX-φY) of the incident elliptically polarized light is π/6 the transmittance of elliptical polarized light is decreased from 1 to 0.6404, and the phase difference (φX-φY) is increased from π/6 to 0.3565π; then, when the center wavelength is 1550 nm, the applied magnetic field remains unchanged and the N is changed from 1 to 9, the transmittance of the elliptical polarized light is decreased from 1 to 0.2343, and the phase difference (φX-φY) is increased from π/6 to 0.7363π.
Traditional phase shifting shape measurement techniques not suitable for dynamic measurement because it need a certain
number of pieces of fringe pattern. In this paper, the basic principle of the fringe projection shape measurement
technique was introduced, the method of single fringe pattern phase extraction by Hilbert transform was discussed, and
conducted three-dimensional shape measurement tests. Experimental results show that 3-D shape measurement can be
achieved by Hilbert transform phase-shifting, and it suitable for dynamic measurement.