Yingqian Ni
at Chongqing Institute of Metrology And Quality Inspection
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Sensors, Standards development, Calibration, Laser scanners, Inspection, Imaging systems, 3D metrology, Metrology, Optical sensors, Laser development

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Particles, Water, Dynamic light scattering, Light scattering, Scattering, Inspection, Bridges, Infrared imaging, Infrared lasers, Infrared radiation

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