Yingqing Chen
at Harbin Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 May 2019 Paper
Yingqing Chen, Sining Li, Wei Lu, Zijian Li, Gang Liu
Proceedings Volume 11170, 1117008 (2019) https://doi.org/10.1117/12.2531466
KEYWORDS: Calibration, Phase shifts, Cameras, Imaging systems, Microelectromechanical systems, CCD cameras, 3D metrology, Phase shifting, Fringe analysis

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