Yingqing Chen
at Harbin Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 May 2019 Paper
Proc. SPIE. 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019)
KEYWORDS: Calibration, Phase shifts, Cameras, Imaging systems, Microelectromechanical systems, CCD cameras, 3D metrology, Phase shifting, Fringe analysis

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