Dr. Yingwei He
at National Institute of Metrology
SPIE Involvement:
Publications (44)

Proceedings Article | 30 April 2024 Paper
Proceedings Volume 13153, 131531K (2024) https://doi.org/10.1117/12.3020162
KEYWORDS: Sensors, Imaging systems, Image sensors, Cameras, Measurement uncertainty

Proceedings Article | 30 April 2024 Paper
Qi Zang, Shaozhe Cui, Weijie Wang, Tao Liang, Xiaolu Zhan, Wende Liu, Yingwei He, Zhengang Lu, Haiyong Gan
Proceedings Volume 13153, 1315318 (2024) https://doi.org/10.1117/12.3018684
KEYWORDS: Laser scanners, Galvanometers, Calibration, Mirrors, Beam controllers, Servomechanisms, Light sources and illumination, Laser frequency, Beam steering, Scanners

Proceedings Article | 27 March 2022 Paper
Zhengxing Qiu, Yingce Wang, Changyu Shen, Xiangliang Liu, Yangting Fu, Yingwei He, Haiyong Gan
Proceedings Volume 12169, 121698U (2022) https://doi.org/10.1117/12.2625187
KEYWORDS: Sensors, Cameras, Target detection, LIDAR, Target recognition, Clouds, Signal detection

Proceedings Article | 5 November 2020 Paper
Proceedings Volume 11567, 115673R (2020) https://doi.org/10.1117/12.2580225
KEYWORDS: Calibration, Integrating spheres, Microscopes, Luminescence, Light sources, Microscopy, Sensors, Radiometry

Proceedings Article | 5 November 2020 Paper
Proceedings Volume 11567, 115674E (2020) https://doi.org/10.1117/12.2580375
KEYWORDS: Optical fibers, Sensors, Photodetectors, Signal detection, Single photon detectors, Light sources, Multiplexers, Photon counting

Showing 5 of 44 publications
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