Dr. Yingwei He
at China Academy of Telecommunication Research
SPIE Involvement:
Publications (22)

PROCEEDINGS ARTICLE | January 18, 2019
Proc. SPIE. 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Mirrors, Light sources, Calibration, Spectroscopy, Mercury, Lamps, Fourier transforms, Monochromators, Off axis mirrors, Light

PROCEEDINGS ARTICLE | December 12, 2018
Proc. SPIE. 10845, Three-Dimensional Image Acquisition and Display Technology and Applications
KEYWORDS: Light sources, Reflection, Imaging systems, Cameras, Calibration, Image processing, Digital cameras, Bidirectional reflectance transmission function, Statistical modeling, RGB color model

PROCEEDINGS ARTICLE | November 8, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Calibration, Solar cells, Xenon, Halogens, Multijunction solar cells, Standards development

PROCEEDINGS ARTICLE | November 7, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Mirrors, Light sources, Calibration, Error analysis, Mercury, Lamps, Fourier transforms, Neon, Monochromators, Light

PROCEEDINGS ARTICLE | November 5, 2018
Proc. SPIE. 10814, Optoelectronic Devices and Integration VII
KEYWORDS: Photovoltaics, Light sources, Metrology, Calibration, Solar cells, Computer simulations, Diodes, Transmittance, Laser optics, Standards development

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Light sources, Metrology, Sensors, Calibration, Silicon, Quantum efficiency, Radiometry, Standards development

Showing 5 of 22 publications
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