Dr. Ymin Gan
at Univ Kassel
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | August 14, 2006
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Phase shifting, Ferroelectric materials, Modulation, Calibration, Phase shift keying, Gallium nitride, Transducers, Shearography, Algorithm development, Phase shifts

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Fringe analysis, Defect detection, Sensors, Nondestructive evaluation, Computer simulations, Gallium nitride, Vibrometry, Laser Doppler velocimetry, Shearography, Statistical methods

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Fringe analysis, Modulation, Interferometry, Nondestructive evaluation, Semiconductor lasers, Speckle pattern, Vibrometry, Shearography, Bessel functions, Phase shifts

PROCEEDINGS ARTICLE | June 22, 2004
Proc. SPIE. 5503, Sixth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications
KEYWORDS: Fringe analysis, Modulation, Interferometry, Semiconductor lasers, Speckle pattern, Vibrometry, Shearography, Pulsed laser operation, Bessel functions, Phase shifts

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Speckle, Nondestructive evaluation, Structured optical fibers, Control systems, Semiconductor lasers, CCD cameras, Vibrometry, Measurement devices, Shearography, Digital recording

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