Dr. Yngve Lien
at Kongsberg Defence & Aerospace AS
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | November 21, 2017
Proc. SPIE. 10567, International Conference on Space Optics — ICSO 2006
KEYWORDS: Microscopes, Polyurethane, Contamination, Ultraviolet radiation, Luminescence, Silicon, Optical testing, Epoxies, Astronomical imaging, UV optics

PROCEEDINGS ARTICLE | November 21, 2017
Proc. SPIE. 10567, International Conference on Space Optics — ICSO 2006
KEYWORDS: Optical components, Contamination, Cameras, Laser induced damage, Laser development, Nd:YAG lasers, Optical coatings, Optical testing, Laser damage threshold, Pulsed laser operation

PROCEEDINGS ARTICLE | November 20, 2017
Proc. SPIE. 10565, International Conference on Space Optics — ICSO 2010
KEYWORDS: Electronics, Safety, Satellites, Interfaces, Control systems, Semiconductor lasers, Explosives, Connectors, Astronomical imaging, Laser optics

PROCEEDINGS ARTICLE | November 20, 2017
Proc. SPIE. 10565, International Conference on Space Optics — ICSO 2010
KEYWORDS: Calibration, Manufacturing, Reliability, Laser applications, Laser development, Inspection, Optical inspection, Astronomical imaging, Electro optics, Lead

PROCEEDINGS ARTICLE | December 20, 2007
Proc. SPIE. 6720, Laser-Induced Damage in Optical Materials: 2007
KEYWORDS: Microscopes, Contamination, Silica, Ultraviolet radiation, Luminescence, Photomultipliers, Fluorescence spectroscopy, Laser induced fluorescence, Semiconductor lasers, UV optics

PROCEEDINGS ARTICLE | January 15, 2007
Proc. SPIE. 6403, Laser-Induced Damage in Optical Materials: 2006
KEYWORDS: Polyurethane, Contamination, Silica, Ultraviolet radiation, In situ metrology, Luminescence, Silicon, Fluorescence spectroscopy, Epoxies, Chemical analysis

Showing 5 of 9 publications
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