Yoel Zabar
at SCD SemiConductor Devices
SPIE Involvement:
Publications (4)

Proceedings Article | 5 April 2007 Paper
Yoel Zabar, Chaim Braude, Shmoolik Mangan, Dan Rost, Raunak Mann
Proceedings Volume 6518, 65183G (2007) https://doi.org/10.1117/12.713947
KEYWORDS: Photomasks, Polarization, Inspection, Airborne remote sensing, Semiconducting wafers, Wafer-level optics, Immersion lithography, Reticles, Lithographic illumination, Defect detection

Proceedings Article | 21 October 2005 Paper
Proceedings Volume 5978, 597816 (2005) https://doi.org/10.1117/12.632803
KEYWORDS: Sensors, Staring arrays, Camera shutters, Single crystal X-ray diffraction, Temperature metrology, Target detection, Unattended ground sensors, Target recognition, Unmanned aerial vehicles, Bolometers

Proceedings Article | 29 September 2005 Paper
A. Fraenkel, U. Mizrahi, L. Bykov, A. Adin, E. Malkinson, Y. Zabar, D. Seter, Y. Gebil, Z. Kopolovich
Proceedings Volume 5957, 59570N (2005) https://doi.org/10.1117/12.621041
KEYWORDS: Sensors, Camera shutters, Staring arrays, Single crystal X-ray diffraction, Readout integrated circuits, Sensor performance, Cameras, Bolometers, Electronics, Nonuniformity corrections

Proceedings Article | 31 May 2005 Paper
U. Mizrahi, A. Fraenkel, L. Bykov, A. Giladi, A. Adin, E. Ilan, N. Shiloah, E. Malkinson, Y. Zabar, D. Seter, R. Nakash, Z. Kopolovich
Proceedings Volume 5783, (2005) https://doi.org/10.1117/12.607445
KEYWORDS: Staring arrays, Sensors, Single crystal X-ray diffraction, Camera shutters, Readout integrated circuits, Cameras, Detector development, Optical calibration, Image resolution, Bolometers

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