Yoel Zabar
at SCD SemiConductor Devices
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 5 April 2007
Proc. SPIE. 6518, Metrology, Inspection, and Process Control for Microlithography XXI
KEYWORDS: Wafer-level optics, Reticles, Lithographic illumination, Defect detection, Polarization, Inspection, Photomasks, Immersion lithography, Semiconducting wafers, Airborne remote sensing

Proceedings Article | 21 October 2005
Proc. SPIE. 5978, Sensors, Systems, and Next-Generation Satellites IX
KEYWORDS: Target detection, Staring arrays, Bolometers, Unmanned aerial vehicles, Sensors, Target recognition, Camera shutters, Unattended ground sensors, Temperature metrology, Single crystal X-ray diffraction

Proceedings Article | 29 September 2005
Proc. SPIE. 5957, Infrared Photoelectronics
KEYWORDS: Staring arrays, Bolometers, Readout integrated circuits, Nonuniformity corrections, Electronics, Cameras, Sensors, Sensor performance, Camera shutters, Single crystal X-ray diffraction

Proceedings Article | 31 May 2005
Proc. SPIE. 5783, Infrared Technology and Applications XXXI
KEYWORDS: Staring arrays, Bolometers, Readout integrated circuits, Cameras, Sensors, Image resolution, Detector development, Optical calibration, Camera shutters, Single crystal X-ray diffraction

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top