Yogesh C. Diwan
Student at Indian Institute of Science
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Diffraction, Mirrors, Digital photography, Cameras, Error analysis, Fourier transforms, Digital cameras, Gaussian filters, Phase measurement, Motion estimation

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