Dr. Yohei Otoki
at SCIOCS
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 16, 2017
Proc. SPIE. 10104, Gallium Nitride Materials and Devices XII
KEYWORDS: Crystals, Silicon, Doping, Control systems, Mass spectrometry, Gallium nitride, Sapphire, Epitaxy, Semiconducting wafers, Material purity

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top