Yohjiro Kawai
at Meijo Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 February 2008
Proc. SPIE. 6889, Physics and Simulation of Optoelectronic Devices XVI
KEYWORDS: Annealing, Crystals, Indium, Atomic force microscopy, Gallium nitride, Sapphire, Indium gallium nitride, Zinc oxide, Vapor phase epitaxy, Temperature metrology

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