Mr. Yoichi Ohmura
at Mitsubishi Electric Corp
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | July 1, 2007
OE Vol. 46 Issue 07
KEYWORDS: Sensors, Distortion, Modulation transfer functions, Spatial frequencies, Imaging systems, Optical transfer functions, Point spread functions, Optical engineering, Signal to noise ratio, Prototyping

PROCEEDINGS ARTICLE | August 27, 2005
Proc. SPIE. 5858, Nano- and Micro-Metrology
KEYWORDS: Staring arrays, Signal to noise ratio, Optical transfer functions, Point spread functions, Metrology, Spatial frequencies, Sensors, Reflectivity, Distortion, Modulation transfer functions

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