Prof. Yong Soo Lee
Professor
SPIE Involvement:
Author
Publications (18)

Proceedings Article | 11 June 2013
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Microbolometers, Oxides, Thin films, Sputter deposition, X-ray diffraction, Nickel, Resistance, Oxygen, Scanning electron microscopy, Temperature metrology

Proceedings Article | 31 May 2012
Proc. SPIE. 8353, Infrared Technology and Applications XXXVIII
KEYWORDS: Microbolometers, Crystals, Silicon, Resistance, Gallium nitride, Aluminum nitride, Field effect transistors, Silicon carbide, Metalorganic chemical vapor deposition, Gallium

Proceedings Article | 21 May 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Amorphous silicon, Microbolometers, Oxides, Sputter deposition, Metals, Nickel, Resistance, Heat treatments, Oxygen, Oxidation

Proceedings Article | 4 May 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Staring arrays, Readout integrated circuits, Infrared cameras, Oxides, Thermography, Infrared imaging, Silicon, Infrared radiation, Gamma radiation, Integrated circuit design

Proceedings Article | 4 May 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Amorphous silicon, Bolometers, Microbolometers, Oxides, Thin films, Metals, Nickel, Resistance, Oxygen, Electrical engineering

Showing 5 of 18 publications
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