Dr. Yong S. Chu
Physicist at Brookhaven National Lab
SPIE Involvement:
Conference Program Committee | Author
Publications (14)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: X-ray fluorescence spectroscopy, Synchrotrons, Light sources, X-rays, Nanoprobes, Hard x-rays, Fluorescence spectroscopy

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: Optical design, Coherence imaging, X-rays, Optical simulations, Coherence (optics), X-ray optics, Laser scattering, Scattering, Wave propagation, X-ray sources

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: X-rays, Optical simulations, Synchrotron radiation, X-ray optics, Wavefronts, Light wave propagation, Light sources, Device simulation, Wave propagation, Electron beams

PROCEEDINGS ARTICLE | September 18, 2015
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: Mirrors, Curium, Silicon, X-ray imaging, Crystals, Objectives, Monochromators, X-rays, Microscopes, Spatial resolution

PROCEEDINGS ARTICLE | March 7, 2014
Proc. SPIE. 8975, Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII
KEYWORDS: Nanofibers, Microelectromechanical systems, Thermoelectric materials, Silicon, Oxides, Silica, Platinum, Scanning electron microscopy, Phonons, Nanostructures

PROCEEDINGS ARTICLE | October 19, 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: Multilayers, Sputter deposition, Nitrogen, Scanning electron microscopy, Silicon, Reflectivity, X-ray optics, X-rays, Metrology, Control systems

Showing 5 of 14 publications
Conference Committee Involvement (1)
X-Ray Nanoimaging: Instruments and Methods III
7 August 2017 | San Diego, California, United States
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