Dr. Yong S. Chu
Physicist at Brookhaven National Lab
SPIE Involvement:
Conference Program Committee | Author
Publications (14)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Light sources, X-rays, Fluorescence spectroscopy, Nanoprobes, Synchrotrons, Hard x-rays, X-ray fluorescence spectroscopy

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: Coherence imaging, Optical design, X-ray optics, Coherence (optics), Scattering, X-rays, X-ray sources, Laser scattering, Wave propagation, Optical simulations

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: Electron beams, Light sources, X-ray optics, X-rays, Wavefronts, Wave propagation, Optical simulations, Synchrotron radiation, Device simulation, Light wave propagation

PROCEEDINGS ARTICLE | September 18, 2015
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: Microscopes, Mirrors, Curium, Crystals, X-rays, Silicon, Objectives, Spatial resolution, Monochromators, X-ray imaging

PROCEEDINGS ARTICLE | March 7, 2014
Proc. SPIE. 8975, Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII
KEYWORDS: Microelectromechanical systems, Oxides, Nanostructures, Silica, Silicon, Platinum, Scanning electron microscopy, Phonons, Nanofibers, Thermoelectric materials

PROCEEDINGS ARTICLE | October 19, 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: Multilayers, X-ray optics, Metrology, Sputter deposition, X-rays, Silicon, Nitrogen, Reflectivity, Control systems, Scanning electron microscopy

Showing 5 of 14 publications
Conference Committee Involvement (1)
X-Ray Nanoimaging: Instruments and Methods III
7 August 2017 | San Diego, California, United States
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