Yong Gan
at Guilin Univ of Electronic Technology
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | August 18, 2011
Proc. SPIE. 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
KEYWORDS: Visualization, Image processing, Nondestructive evaluation, 3D modeling, 3D metrology, Charge-coupled devices, Reconstruction algorithms, Velocity measurements, Reverse engineering, Liquids

PROCEEDINGS ARTICLE | February 19, 2008
Proc. SPIE. 6625, International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications
KEYWORDS: Mathematical modeling, Digital image processing, Image processing, Error analysis, Nondestructive evaluation, Image analysis, Mathematics, Image classification, Testing and analysis, Standards development

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