Dr. Yong Yang
at Institute of Optics and Electronics CAS
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | October 22, 2010
Proc. SPIE. 7657, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
KEYWORDS: Metamaterials, Surface plasmon polaritons, Optical lithography, Metals, Near field, Wave propagation, Photomasks, Nanolithography, Radio propagation, Near field optics

PROCEEDINGS ARTICLE | January 4, 2008
Proc. SPIE. 6832, Holography and Diffractive Optics III
KEYWORDS: Diffraction, Point spread functions, Telescopes, Apodization, Optical spheres, Imaging systems, Image resolution, Wavefronts, Space telescopes, Resolution enhancement technologies

PROCEEDINGS ARTICLE | November 29, 2007
Proc. SPIE. 6833, Electronic Imaging and Multimedia Technology V
KEYWORDS: Target detection, Detection and tracking algorithms, Image segmentation, Image processing, Image analysis, Image quality, Image filtering, Image enhancement, Image contrast enhancement, Algorithms

PROCEEDINGS ARTICLE | November 29, 2007
Proc. SPIE. 6833, Electronic Imaging and Multimedia Technology V
KEYWORDS: Target detection, Infrared detectors, Signal to noise ratio, Infrared imaging, Detection and tracking algorithms, Image segmentation, Image processing, Digital filtering, Image filtering, Infrared radiation

PROCEEDINGS ARTICLE | November 21, 2007
Proc. SPIE. 6724, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
KEYWORDS: Lithography, Refractive index, Optical lithography, Metals, Silver, Photoresist materials, Near field, Photomasks, Nanolithography, Near field optics

PROCEEDINGS ARTICLE | November 19, 2007
Proc. SPIE. 6724, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
KEYWORDS: Chromatic aberrations, Lithography, Diffraction, Point spread functions, Modulation, Optical properties, Imaging systems, Opacity, X-rays, Image resolution

Showing 5 of 8 publications
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