Dr. Yongkai Yin
at Leibniz University Hannover
SPIE Involvement:
Author
Publications (18)

PROCEEDINGS ARTICLE | November 2, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Laser sources, Prisms, Cameras, Calibration, Laser applications, 3D metrology, Machine vision, Sensor calibration, 3D vision

PROCEEDINGS ARTICLE | May 24, 2018
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Fringe analysis, Cameras, Image processing, Error analysis, Reflectivity, 3D metrology, Projection systems, Optics manufacturing, Phase shifts

PROCEEDINGS ARTICLE | February 20, 2018
Proc. SPIE. 10697, Fourth Seminar on Novel Optoelectronic Detection Technology and Application
KEYWORDS: Beam splitters, Logic, Gaussian beams, Dielectrics, Silicon, Photonic crystals, Computer simulations, Transmittance, Logic devices, Destructive interference

PROCEEDINGS ARTICLE | February 10, 2017
Proc. SPIE. 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016)
KEYWORDS: Phase shifting, Calibration, Error analysis, Phase shifts

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Semiconductors, Fringe analysis, 3D image reconstruction, Spatial frequencies, Cameras, Inspection, Electronic components, Telecommunications, 3D metrology, Projection systems

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Fringe analysis, Modulation, Imaging systems, Cameras, Ceramics, Reflectivity, Phase shift keying, 3D metrology, Algorithm development, 3D image processing

Showing 5 of 18 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top