Yongwoo Lee
at Samsung Display Co., Ltd.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 March 2020
Proc. SPIE. 11326, Advances in Patterning Materials and Processes XXXVII
KEYWORDS: Lithography, Optical transfer functions, Data modeling, Image processing, Diffusion, Image resolution, Neural networks, Photomasks, Machine learning, Performance modeling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top