Dr. Yoram Karni
Physics and Electro-optics Director at SCD SemiConductor Devices
SPIE Involvement:
Author
Publications (18)

PROCEEDINGS ARTICLE | May 23, 2018
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Staring arrays, Hyperspectral imaging, Infrared imaging, Short wave infrared radiation, Optical filters, Imaging systems, Cameras, Sensors, Image filtering, Modulation transfer functions, High angular resolution imaging

PROCEEDINGS ARTICLE | May 16, 2017
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Staring arrays, Readout integrated circuits, Infrared detectors, Mid-IR, Imaging systems, Sensors, Image sensors, Electro optical sensors, Telecommunications, Electro optics, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | June 24, 2014
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Staring arrays, Readout integrated circuits, Mid-IR, Sensors, Diffusion, Interference (communication), Image quality, Detector development, Diodes, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | March 4, 2013
Proc. SPIE. 8640, Novel In-Plane Semiconductor Lasers XII
KEYWORDS: Mid-IR, Mirrors, FT-IR spectroscopy, Spectroscopy, Reliability, Laser development, Electroluminescence, Semiconductor lasers, Scanning electron microscopy, Laser ablation

PROCEEDINGS ARTICLE | February 9, 2012
Proc. SPIE. 8241, High-Power Diode Laser Technology and Applications X
KEYWORDS: Multimode fibers, Data modeling, Reliability, Resistance, Fiber lasers, Semiconductor lasers, Failure analysis, Temperature metrology, Near field optics

PROCEEDINGS ARTICLE | May 26, 2011
Proc. SPIE. 8039, Laser Technology for Defense and Security VII
KEYWORDS: Packaging, Reliability, Laser development, Solid state lasers, Fiber lasers, Semiconductor lasers, Head, Diodes, Semiconducting wafers, Single crystal X-ray diffraction

Showing 5 of 18 publications
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