Dr. Yoshiharu Morimoto
Representative Director at Moire Institute Inc
SPIE Involvement:
Senior status | Conference Program Committee | Author
Publications (32)

SPIE Journal Paper | October 1, 2011
OE Vol. 50 Issue 10
KEYWORDS: Cameras, CCD cameras, Fringe analysis, Phase shifts, Shape analysis, 3D metrology, Optical engineering, Image processing, Phase measurement, 3D image processing

SPIE Journal Paper | October 1, 2009
OE Vol. 48 Issue 10
KEYWORDS: Digital micromirror devices, Cameras, Calibration, Charge-coupled devices, Mirrors, CCD cameras, Phase shifts, 3D image processing, 3D metrology, LCDs

PROCEEDINGS ARTICLE | August 25, 2009
Proc. SPIE. 7375, ICEM 2008: International Conference on Experimental Mechanics 2008
KEYWORDS: Fringe analysis, Phase shifting, Cameras, Sensors, Metals, Image processing, Error analysis, Computer simulations, Image analysis, Phase shifts

PROCEEDINGS ARTICLE | August 29, 2008
Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI
KEYWORDS: Phase shifting, Radon, Cameras, Calibration, Image processing, Distortion, CCD cameras, LCDs, Projection systems, Phase shifts

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Light sources, Fringe analysis, Holograms, Digital holography, Calibration, Fourier transforms, Holographic interferometry, Spherical lenses, Phase shifts, Light

SPIE Journal Paper | February 1, 2007
OE Vol. 46 Issue 02
KEYWORDS: Holograms, Holographic interferometry, Digital holography, 3D image reconstruction, Speckle, Phase shifts, Optical engineering, Error analysis, Charge-coupled devices, Holography

Showing 5 of 32 publications
Conference Committee Involvement (3)
Optical Micro- and Nanometrology in Microsystems Technology
8 April 2008 | Strasbourg, France
Optical Micro- and Nanometrology in Microsystems Technology
5 April 2006 | Strasbourg, France
Optical Micro- and Nanometrology in Manufacturing Technology
29 April 2004 | Strasbourg, France
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