Dr. Yoshiharu Morimoto
CEO at 4D Sensor Inc.
SPIE Involvement:
Publications (32)

SPIE Journal Paper | 1 October 2011
OE Vol. 50 Issue 10
KEYWORDS: Cameras, CCD cameras, Fringe analysis, Phase shifts, Shape analysis, 3D metrology, Optical engineering, Image processing, Phase measurement, 3D image processing

SPIE Journal Paper | 1 October 2009
OE Vol. 48 Issue 10
KEYWORDS: Digital micromirror devices, Cameras, Calibration, Charge-coupled devices, Mirrors, CCD cameras, Phase shifts, 3D image processing, 3D metrology, LCDs

Proceedings Article | 25 August 2009
Proc. SPIE. 7375, ICEM 2008: International Conference on Experimental Mechanics 2008
KEYWORDS: Phase shifts, Fringe analysis, Image analysis, Error analysis, Metals, Cameras, Sensors, Image processing, Phase shifting, Computer simulations

Proceedings Article | 29 August 2008
Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI
KEYWORDS: Calibration, Phase shifts, CCD cameras, Distortion, LCDs, Image processing, Projection systems, Cameras, Radon, Phase shifting

Proceedings Article | 11 August 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Spherical lenses, Light sources, Digital holography, Calibration, Phase shifts, Holographic interferometry, Fourier transforms, Holograms, Fringe analysis, Light

Showing 5 of 32 publications
Conference Committee Involvement (3)
Optical Micro- and Nanometrology in Microsystems Technology
8 April 2008 | Strasbourg, France
Optical Micro- and Nanometrology in Microsystems Technology
5 April 2006 | Strasbourg, France
Optical Micro- and Nanometrology in Manufacturing Technology
29 April 2004 | Strasbourg, France
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