Dr. Yoshihiro Ohno
NIST Fellow at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (17)

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Light sources, Light emitting diodes, Optical spheres, Calibration, Luminescence, Error analysis, Lamps, Reflectivity, Integrating spheres, Goniophotometry

SPIE Journal Paper | March 1, 2010
OE Vol. 49 Issue 03
KEYWORDS: Light emitting diodes, Light sources, RGB color model, Lamps, Reflectivity, Colorimetry, Optical engineering, Light sources and illumination, Color difference, Visualization

PROCEEDINGS ARTICLE | August 18, 2009
Proc. SPIE. 7422, Ninth International Conference on Solid State Lighting
KEYWORDS: Thermography, Light emitting diodes, Stars, Solid state lighting, Reliability, Resistance, Power supplies, Optical testing, Product engineering, Temperature metrology

PROCEEDINGS ARTICLE | February 10, 2006
Proc. SPIE. 6046, Fifth Symposium Optics in Industry
KEYWORDS: Light sources, Light emitting diodes, Calibration, Solid state lighting, Lamps, Light sources and illumination, General lighting, Photometry, Luminous efficacy, RGB color model

SPIE Journal Paper | November 1, 2005
OE Vol. 44 Issue 11
KEYWORDS: Light emitting diodes, Calibration, LCDs, Photometry, Light sources, Lamps, Optical engineering, CRTs, Optimization (mathematics), Detection and tracking algorithms

SPIE Journal Paper | November 1, 2005
OE Vol. 44 Issue 11
KEYWORDS: Light emitting diodes, Lamps, RGB color model, Line edge roughness, Luminous efficacy, Light sources, LED lighting, Optical engineering, General lighting, Deep ultraviolet

Showing 5 of 17 publications
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