Dr. Yoshihiro Ohno
NIST Fellow at National Institute of Standards and Technology
SPIE Involvement:
Publications (17)

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Luminescence, Integrating spheres, Optical spheres, Light emitting diodes, Light sources, Goniophotometry, Reflectivity, Lamps, Calibration, Error analysis

SPIE Journal Paper | 1 March 2010
OE Vol. 49 Issue 03
KEYWORDS: Light emitting diodes, Light sources, RGB color model, Lamps, Reflectivity, Colorimetry, Optical engineering, Light sources and illumination, Color difference, Visualization

Proceedings Article | 18 August 2009
Proc. SPIE. 7422, Ninth International Conference on Solid State Lighting
KEYWORDS: Light emitting diodes, Temperature metrology, Solid state lighting, Resistance, Optical testing, Product engineering, Reliability, Thermography, Stars, Power supplies

Proceedings Article | 10 February 2006
Proc. SPIE. 6046, Fifth Symposium Optics in Industry
KEYWORDS: Light emitting diodes, Solid state lighting, Calibration, Luminous efficacy, Light sources and illumination, Light sources, Photometry, Lamps, General lighting, RGB color model

SPIE Journal Paper | 1 November 2005
OE Vol. 44 Issue 11
KEYWORDS: Light emitting diodes, Calibration, LCDs, Photometry, Light sources, Lamps, Optical engineering, CRTs, Optimization (mathematics), Detection and tracking algorithms

Showing 5 of 17 publications
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