Yoshiyuki Umegaki
at JFE Steel Corp
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 23, 2014
Proc. SPIE. 9217, Applications of Digital Image Processing XXXVII
KEYWORDS: Statistical analysis, Silica, Scattering, Image processing, Particles, Chromium, Image analysis, Image transmission, Image classification, Adhesives

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