Young Bong Shin
at KAIST
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 May 2019 Paper
Proceedings Volume 11001, 110011A (2019) https://doi.org/10.1117/12.2518815
KEYWORDS: Aluminum, Thin films, Resistors, Infrared imaging, Infrared sensors, Sputter deposition, Semiconducting wafers, Infrared radiation

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