Dr. Young-Hoon Kim
at Seoul National Univ
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | September 8, 2010
Proc. SPIE. 7797, Optics and Photonics for Information Processing IV
KEYWORDS: Displays, Image resolution, LCDs, Projection systems, Optical resolution, Flat panel displays, 3D displays, Autostereoscopic displays, Lenticular lenses, 3D image processing

PROCEEDINGS ARTICLE | March 24, 2006
Proc. SPIE. 6152, Metrology, Inspection, and Process Control for Microlithography XX
KEYWORDS: Ellipsometry, Lithography, Reticles, Air contamination, Spectroscopic ellipsometry, Transmittance, Photomasks, Critical dimension metrology, Binary data, Phase shifts

PROCEEDINGS ARTICLE | November 9, 2005
Proc. SPIE. 5992, 25th Annual BACUS Symposium on Photomask Technology
KEYWORDS: Semiconductors, Ellipsometry, Reticles, Air contamination, Spectroscopy, Inspection, Atomic force microscopy, Spectroscopic ellipsometry, Transmittance, Photomasks

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