Dr. Young-Hoon Kim
at Seoul National Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 8 September 2010
Proc. SPIE. 7797, Optics and Photonics for Information Processing IV
KEYWORDS: 3D displays, Displays, Autostereoscopic displays, 3D image processing, Lenticular lenses, Image resolution, LCDs, Flat panel displays, Optical resolution, Projection systems

Proceedings Article | 24 March 2006
Proc. SPIE. 6152, Metrology, Inspection, and Process Control for Microlithography XX
KEYWORDS: Air contamination, Photomasks, Transmittance, Critical dimension metrology, Spectroscopic ellipsometry, Ellipsometry, Reticles, Phase shifts, Binary data, Lithography

Proceedings Article | 9 November 2005
Proc. SPIE. 5992, 25th Annual BACUS Symposium on Photomask Technology
KEYWORDS: Air contamination, Reticles, Photomasks, Ellipsometry, Transmittance, Inspection, Spectroscopic ellipsometry, Spectroscopy, Semiconductors, Atomic force microscopy

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