Dr. Young-Sik Ghim
Principal Research Scientist at Korea Research Institute of Standards and Science
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Multilayers, Interferometry, 3D metrology

Proceedings Article | 16 October 2017
Proc. SPIE. 10451, Photomask Technology 2017
KEYWORDS: Thermography, Optical components, Lithography, Diffractive optical elements, Manufacturing, Laser ablation, Photomasks, Optics manufacturing, Polonium

Proceedings Article | 16 October 2012
Proc. SPIE. 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Mirrors, Polishing, Polishing equipment, Interferometers, Calibration, Optical fabrication, Heterodyning, Optical encoders, Aspheric optics, Finite element methods

Proceedings Article | 16 October 2012
Proc. SPIE. 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Polishing, Polyurethane, Chemical species, Sputter deposition, Ions, Surface roughness, Ion beams, Optical simulations, Ion beam finishing, Surface finishing

Proceedings Article | 13 September 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Confocal microscopy, Microscopes, Metrology, Optical spheres, Interferometers, Calibration, Error analysis, Interferometry, Profilometers, Spherical lenses

Showing 5 of 12 publications
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