Yu-Heng Lo
at National Sun Yat-sen Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11123, 111230T (2019) https://doi.org/10.1117/12.2530711
KEYWORDS: Inspection, Microscopes, Fringe analysis, 3D metrology, Projection systems, Image sensors, CCD cameras, Imaging arrays, Modulation, Fourier transforms

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