The Vitamin D synthesis mainly takes place in skin after solar exposure of UVB, but usually the solar exposure dose is not adequate with modern daily activity. Thus, it is a novel solution to develop home-use UV health lamp to compensate the vitamin-D deficient. In this study, a low dose and narrow band UV-B lamps was developed for animal study. The lamp design was based on arrangement of UV-B light bulbs, band pass filters and electric-mechanical devices. The vitamin D synthesis of mice under various irradiation conditions was observed and analyzed. The experimental results show that the UV light with a wavelength of 310-320 nm can effectively improve the vitamin D synthesis and minimize the skin damage.
The absorbing filter [1] is an optical element employed for isolating regions of a spectrum. In general, the thicker the absorbing filter material, the more wavelengths it will absorb. However, most optical filter products ignore light diffusion and are made with a constant thickness. While the non-collimated beams pass through the filter, the optical paths vary with incident angles. Thus, the absorption difference happens and leads to the poor uniformity of transmission spectrum. In our work, a filter lens was developed to achieve the similar function of interference filter and ND filter with better spectrum uniformity. It is mounted onto a designed macro lens and supplies it with a good spectrum aberration correction. The shape of the filter lens is designed to eliminate the optical path differences between the light beams in the medium. The macro lens is made of neutral glass and shaped into symmetrical biconvex for achieving macro imaging. The spectrum characteristic of the filter lens depends on the material of the absorbing filter. In the experiment, the filter lens was prepared. The experimental results show that the spectrum uniformity of the filter lens is better than that of the normal filter.
For years, the technology of TFT-LCDs (thin-film-transistor liquid crystal displays) has grown very rapidly,
especially in the market share and technical development of FPD industries. To effectively promote the industry's
capacity for the mass production and quality control, it is urgent to design and develop LC cell optical parameter
measurement systems. The goal of this paper is to develop a multiple-functional and cost-effective measurement
system to lower the manufacturing cost for the industry. The optical parameters includes the pretilt angle, liquid
crystal (LC) cell gap (or phase retardation), and twist angle, which highly influence the display quality. In this paper,
we first study the past approaches and analyze their measurement performance. Then, a simple and cost-effective
method is proposed to achieve the multiple functions. That is, in addition to the precise measurement of the three
important optical parameters, the proposed system can measure the voltage-transmittance (V-T) curve. In our
approach, the theoretical study, simulation, and experiment are performed to show the feasibility of the system
implementation. Finally, the proposed system is developed to automatically measure the LC cell parameters.
Experimental results indicate that the proposed measurement system gives a satisfactory result.
It is well known that white light interferometry (WLI) is important to nano-scale 3-D profile measurement technology.
To archive cost-effective and accurate measurements, the researches for WLI are widely spreading. Our objective is to
build up a 3-D micro-structure profile measurement system based on WLI, for micro-mechatronic, micro-optical, and
semi-conductor devices. This paper briefly reviews related WLI theory and then the principle of spectral coherence is
employed to improve the system design. Specifically, proper spectral filters can be used to extend the coherence length
of the light source to the order of several ten micrometers. That is, the coherence length of the filtered light source is
longer than that of the original source. In this paper, Michelson interference experiments are conducted with filtered and
unfiltered white light sources, to show the feasibility of the concept of spectral coherence. The Michelson interferometer
is adopted due to its convenience of optical installation and its acceptable tolerance to noise. The experiment results
indicate that our approach is feasible and thus it can improve the WLI measurement performance.
Liquid crystal displays (LCDs) or thin-film transistor (TFT) LCDs have been regarded as a promising technology in flat panel displays (FPDs). To meet the demands of the mass production and quality control, the development of automatic electro-optical characteristics measurement systems for LCDs is very important. To achieve this, we propose a generalized spectroscopic ellipsometry (GSE) based technique to measure the characteristics of LCDs. Our approach involves two primary steps. First, we review a theoretical basis for generalized spectroscopic ellipsometries for the LCD measurement. Those are mainly categorized into two classes of ellipsometries: the transmission variable angle spectroscopic ellipsometry (VASE) and the spectroscopic ellipsometry (SE) using a photoelastic modulator (PEM), called PEM SE. Second, on the basis of the VASE and PEM SE, we present a GSE-based system to measure the electro-optical characteristics for twisted nematic liquid crystals (TNLCs) and super twisted nematic liquid crystals (STNLCs). In this paper, the simulation results indicate the feasibility of this technique. Finally, the automatic GSE-based system is presented for measuring the LCD electro-optical characteristics.
White light interferometry (WLI) has played an important role in nano- and micro-scale profile measurement technology. To meet the demand of high-accuracy, high-repeatability, and cost-effective measurement, the research activities on WLI and its applications are rapidly in progress. WLI is based on the superposition of waves with different but very close wavelengths to produce beat phenomena (or to generate detectable envelopes in the interferogram) and then to identify the locations of the zero-order interference fringes (or those of the maximum intensities of interference fringes without the optical path difference). The locations reflect the information of three dimensional (3D) surface profiles from the consecutively acquired images in a WLI system. The objective of this paper is to develop a high-accuracy and cost-effective WLI measurement system, especially for the surfaces of micro-mechatronic devices, micro-optical components, semiconductor devices, etc. In our approach, the feasibility of the use of spectral coherence properties to meet the system design requirement is first investigated. Specifically, proper spectral filters are employed to enhance the coherence length of the light source (i.e., that of the filtered light source) to an order of ten micrometers. Then, a Young's double-slit interference experiment with filtered and unfiltered white light sources is conducted to demonstrate the effectiveness of this technique. Also, we adopt a Michelson interferometric configuration as the optical module of the proposed WLI system, for the sake of its simplicity. Experimental results indicate that several inexpensive spectral filters, a lower-grade charge-couple-device (CCD) image sensor, and a PZT (piezoelectric transducer) with a lower movement resolution are merely needed to develop the WLI system, instead of the use of higher-grade optical and optomechanical components. It turns out that the proposed system with high-accuracy measurement performance is more cost-effective than others.
The confocal imaging has become one of the most widely applied microscopic techniques in various fields, such as biotechnology, automation engineering, optical engineering, solid-state physics, metallurgy, integrated circuit inspection, etc. Confocal laser scanning microscopy (CLSM) is primarily based on the use of apertures in the detection path to provide the acquired three-dimensional images with satisfactory contrast and resolution. The major objective of this paper is to analyze the imaging performance of the confocal microscopes with varying opto-mechanical conditions. In this paper, the working principles of the one- and two-dimensional scanning mechanisms in the microscopic systems are first reviewed and verified by opto-mechanical simulations. Then, for the imaging performance, the tolerance to the fabrication and assembly of the optical components in conventional confocal microscopes is also investigated by simulations. The simulation results indicate the importance of eliminating the effects of stray light in the microscopic systems.
KEYWORDS: Near field optics, Thin films, Scanning electron microscopy, Silver, Near field, Charge-coupled devices, Optical properties, Scattering, Reflectivity, Near field scanning optical microscopy
AgOx thin-films were studied by using an optical read-write-tester. Two different states were found by CCD and SEM images, and the optical properties were examined by the pump-probe technique. A scattering center was found in the AgOx thin film. The enhanced reflectance was due to strongly local scattering and plasmon excitations.
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