We describe the optimum design of the near-field scanning optical microscope (NSOM) based on a short probe tapping mode tuning-fork (TMTF) configuration and its applications in optoelectronic characterization and optical measurements. The short probe TMTF-NSOM is constructed to operate both in collection and excitation modes, in which a cleaved short fiber probe attached to one tine of the tuning fork is used as the light collector/emitter as well as the force sensing element. Interference fringes due to standing evanescent waves generated by total internal reflection are imaged by collection mode. On the other hand, excitation mode of short probe TMTF-NSOM is applied to perform near-field surface photovoltage measurements on AlGaInP light emitting diode structures.
KEYWORDS: 3D scanning, Laser applications, 3D acquisition, Laser scanners, Cameras, Clouds, 3D metrology, Optical design, Optical testing, Data processing
This study applies 3D Laser scanning technology to develop a high-precision measuring system for digital survey of historical building. It outperformed other methods in obtaining abundant high-precision measuring points and computing data instantly. In this study, the Pei-tien Temple, a Chinese Taoism temple in southern Taiwan famous for its highly intricate architecture and more than 300-year history, was adopted as the target to proof the high accuracy and efficiency of this system. By using French made MENSI GS-100 Laser Scanner, numerous measuring points were precisely plotted to present the plane map, vertical map and 3D map of the property. Accuracies of 0.1-1 mm in the digital data have consistently been achieved for the historical heritage measurement.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.