Yu-Ying Lan
at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | July 11, 2016
Proc. SPIE. 10011, First International Workshop on Pattern Recognition
KEYWORDS: Defect detection, Detection and tracking algorithms, Cameras, Signal attenuation, Inspection, Optical inspection, Machine vision, Image enhancement, Binary data, Defect inspection

PROCEEDINGS ARTICLE | September 15, 2008
Proc. SPIE. 7073, Applications of Digital Image Processing XXXI
KEYWORDS: Mirrors, Beam splitters, Light sources, 3D image reconstruction, Interferometers, Inspection, 3D metrology, Profilometers, Objectives, 3D image processing

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