Dr. Yu Chen
at Sichuan Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 8, 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Eye, Resistance, Corrosion, Ultrasonics, Scanning electron microscopy, Thermal effects, Infrared radiation, Infrared technology, Aircraft structures, Temperature metrology

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