Dr. Yu Ren
at Shanghai Institute of Measurement and Testing Technology
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 23 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Optical spheres, 3D imaging standards, Calibration, Ultrasonography, 3D modeling, Photogrammetry, Laser scanners, Infrared radiation, 3D scanning, Standards development

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Prisms, 3D acquisition, Optical spheres, Calibration, Laser scanners, 3D metrology, 3D scanning, Data centers, Spherical lenses, Standards development

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Aerospace engineering, Interferometers, Calibration, 3D metrology, Atmospheric optics

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Metrology, Genetic algorithms, 3D acquisition, 3D imaging standards, Aerospace engineering, Calibration, Laser applications, Measurement devices, Optimization (mathematics), Environmental sensing

Proceedings Article | 12 January 2018 Paper
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Mathematical modeling, Metrology, Genetic algorithms, Computer programming, Distributed computing, Computer networks, Laser metrology, Optimization (mathematics), Network architectures, Laser systems engineering

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