Dr. Yuan Yang
at Western Digital Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 May 2022 Poster + Paper
Proceedings Volume 12053, 120531R (2022) https://doi.org/10.1117/12.2613501
KEYWORDS: Metrology, Performance modeling, Image processing, Data modeling, Machine learning, Head, Semiconducting wafers, Critical dimension metrology, Magnetism, Cadmium

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