Yuangang Lu
at Shanghai Institute of Optics and Fine Mechanics
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | May 1, 2005
OE Vol. 44 Issue 05
KEYWORDS: Reliability, Algorithm development, Computer simulations, Optical engineering, Image quality, Connectors, 3D image processing, Fringe analysis, Magnetic resonance imaging, Interferometric synthetic aperture radar

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