Yufeng Zhang
at Southeast University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 December 2015 Paper
Yufeng Zhang, Man Long, Sida Luo, Yu Bao, Hanxia Shen
Proceedings Volume 9794, 979431 (2015) https://doi.org/10.1117/12.2202929
KEYWORDS: Calibration, Systems modeling, Reliability, Statistical analysis, Surface plasmons, Roads, Electronics, Electronics engineering, Current controlled current source

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