Dr. Yuhe Li
at Tsinghua Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (13)

Proceedings Article | 3 October 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Microscopes, Prisms, Lithium, Modulation, Visualization, Image processing, Phase shift keying, Image analysis, Geodesy, Phase shifts

Proceedings Article | 3 October 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Laser sources, Mirrors, Beam splitters, Polarization, Error analysis, Interferometry, Photodiodes, Heterodyning, Phase measurement, Signal detection

Proceedings Article | 13 October 2006
Proc. SPIE. 6280, Third International Symposium on Precision Mechanical Measurements
KEYWORDS: Refractive index, Edge detection, Visualization, Sensors, Image processing, Digital filtering, Interferometry, Image filtering, Charge-coupled devices, Near field optics

Proceedings Article | 19 May 2006
Proc. SPIE. 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Statistical analysis, Visualization, Interferometers, Image processing, Surface roughness, Image acquisition, Control systems, Software development, 3D displays, OpenGL

Proceedings Article | 21 March 2006
Proc. SPIE. 6040, ICMIT 2005: Mechatronics, MEMS, and Smart Materials
KEYWORDS: Microelectromechanical systems, Actuators, Microsystems, Photography, Reliability, Pollution control, Finite element methods, Analytical research, Inductance, Device simulation

Showing 5 of 13 publications
Conference Committee Involvement (1)
Symposium Organizing Chairs and Committee
14 October 2002 | Shanghai, China
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