Mr. Yuhua Cheng
at Univ of Electronic Science and Technology of China
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 31, 2013
Proc. SPIE. 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Defect detection, Visualization, Imaging systems, Image segmentation, Image processing, Magnetism, Nondestructive evaluation, Image quality, Molybdenum, Magneto-optics

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