Yuki Yamaguchi
at Osaka Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 November 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Optical components, Metrology, Optical spheres, Imaging systems, Optical testing, Optical tweezers, CMOS cameras, Objectives, Signal detection, Diffraction gratings

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