Yuki Yamana
at Osaka Institute of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 4, 2012
Proc. SPIE. 8530, Laser-Induced Damage in Optical Materials: 2012
KEYWORDS: Near infrared, Visible radiation, Laser induced damage, Laser energy, Silicon, Nd:YAG lasers, Semiconductor lasers, Laser irradiation, Laser damage threshold, Semiconducting wafers

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